01
CS03-6mA30mA-P Series Current Sensor
Model list
Model number | Rated input current IPN (A) | Measuring range IPM (A) |
CS03-6mA/30mA-P | 6mA(DC)/30mA(AC) | 6mA(DC)/30mA(AC) |
CS03-6mA/30mA-P Parameter list
Parameter |
symbol | unit | Minimum value | Typical value | Maximum value | remark |
Electrical parameter | ||||||
Supply voltage | VDD | V | 4.85 | 5 | 5.15 | |
Current consumption | IDD | mA | 20 | - | 80 | |
Rated residual DC operating current | I∆NDC | mA | - | 6 | - | |
Rated remaining AC operating current | I∆NAC | mA | - | 30 | - | |
Residual DC current is given as range value | I∆NDC, Range | mA | 3.2 | 4.5 | 5.8 | |
Residual AC current operating range value | I∆NAC, Range | mA | 18 | 24 | 27 | |
Performance parameter | ||||||
Action output low level voltage | Vtrip- OUT,low | V | 0 | - | 0.6 | |
Action output high level voltage | Vtrip- OUT,high | V | 4.85 | - | 5.15 | |
Self-check input low voltage | V test-IN, low | V | 0 | - | 0.6 | |
Self-check input high level voltage | V test-IN, high | V | 2.5 | - | 5.1 | |
Calibrate the input low-level voltage | V cal-IN, low | V | 0 | - | 0.6 | |
Calibrate the input high level voltage | V cal-IN, high | V | 2.5 | - | 5.1 | |
Universal parameter | ||||||
Operating ambient temperature | TA | ℃ | -40--105 | |||
Storage ambient temperature | TS | ℃ | -40--105 |
Note: Incorrect wiring may damage the sensor
Mechanical dimension

Instructions for use
Pin1 | Vcc | 5V |
Pin2 | TRIP | High level output |
Pin3 | GND | Ground connection |
Pin4 | calibrate | Product accuracy calibration |
Pin5 | self-inspection | Product function self-test |
Sequence chart

1. VDD power-on speed ≥3ms/V
2, T1 ≥ 100ms
3, 50mS ≤T2 ≤100mS, CAL low level time greater than 50mS into the zero calibration, calibration completion time T3≥500mS
4. TEST The self-test signal can only be enabled after T3 is completed, and the required duration is T4 =400mS
5, TRIP pin output high level duration Tx =100mS (verify self-test function), Ty=100ms is TRIP pin high level fading time (prohibit verification self-test function)
Application circuit
